Kohei Yamasue

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Speaker, Author, Co-Author

Fri. Sep 20, 2019 9:00 AM - 12:00 PM E311 (E311)

Oral presentation
| 15 Crystal Engineering
| 15.6 Group IV Compound Semiconductors (SiC)

[20a-E311-1~11] 15.6 Group IV Compound Semiconductors (SiC)

11:45 AM - 12:00 PM

[20a-E311-11] Influence of non-uniform interface defect distribution on channel mobility in SiC MOSFET — Study based on local DLTS measurement and device simulation —

〇Kohei Yamasue¹, Yuji Yamagishi¹, Yasuo Cho¹ (1.Tohoku Univ.)