Soichiro Kamibeppu

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Speaker, Author, Co-Author

Fri. Sep 20, 2019 9:15 AM - 11:30 AM E314 (E314)

Oral presentation
| 16 Amorphous and Microcrystalline Materials
| 16.3 Bulk, thin-film and other silicon-based solar cells

[20a-E314-1~8] 16.3 Bulk, thin-film and other silicon-based solar cells

10:30 AM - 10:45 AM

[20a-E314-5] Investigation for the measurement of crystal orientations of multiclystalline silicon wafer by using optical images

〇(M2)Soichiro Kamibeppu¹, Hikaru Kato², Tetsuya Matsumoto², Kentaro Kutsukake³, Takuto Kojima², Hiroaki Kudo², Noritaka Usami¹ (1.Eng., Nagoya univ., 2.Inf., Nagoya univ., 3.AIP, RIKEN)

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