The 80th JSAP Autumn Meeting 2019

Presentation information

Oral presentation

13 Semiconductors » 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

[18a-E303-1~12] 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

Wed. Sep 18, 2019 9:00 AM - 12:15 PM E303 (E303)

Koichiro Saga(Sony), Takashi Hasunuma(Univ. of Tsukuba)

9:15 AM - 9:30 AM

[18a-E303-2] Design and Verification of Water Flow in Batch-Type Silicon Wafer Wet Cleaner

Toshinori Takahashi1, Miya Matsuo1, Hitoshi Habuka1, Akihiro Goto2 (1.Yokohama Nat. Univ., 2.Pre-Tech)

Keywords:silicon wafer cleaner, water flow

In the process of cleaning a silicon wafer which is a semiconductor substrate material, it is a problem that part of the dirt returns to the wafer surface and reattaches according to the circulating flow of the cleaning tank. In the previous report , in this study, since the cleaning effect by the discharge hole was verified by visualization observation, details are reported. It was shown by numerical calculation that the circulation flow can be suppressed by providing the discharge hole at the upper end of the tank wall.