The 80th JSAP Autumn Meeting 2019

Presentation information

Oral presentation

13 Semiconductors » 13.5 Semiconductor devices/ Interconnect/ Integration technologies

[18p-B11-1~14] 13.5 Semiconductor devices/ Interconnect/ Integration technologies

Wed. Sep 18, 2019 1:15 PM - 5:00 PM B11 (B11)

Masaharu Kobayashi(Univ. of Tokyo), Shinji Migita(AIST), Hitoshi Wakabayashi(Tokyo Tech)

1:15 PM - 1:30 PM

[18p-B11-1] [Young Scientist Presentation Award Speech] Mechanisms of Reverse-DIBL and NDR Observed in Ferroelectric FETs

Chengji Jin1, Takuya Saraya1, Toshiro Hiramoto1, Masaharu Kobayashi1 (1.The Univ. of Tokyo)

Keywords:negative capacitance, steep slope, polarization switching

Ferroelectric FET (FeFET) with steep subthreshold slope (SS) becomes one of the most promising transistor solutions for low-power computing. Since the mechanism of steep SS is based on negative capacitance (NC) effect of ferroelectric (FE), it is also called NCFET. While NCFET is originally proposed by the quasi-static NC (QSNC) theory, recently, it is reported that steep SS can be explained by the transient NC (TNC) theory with dynamics of polarization reversal as well. In this work, we show the previously reported reverse drain-induced barrier lowering (R-DIBL) and negative differential resistance (NDR) can be explained by the TNC theory. Their mechanisms are also discussed.