The 80th JSAP Autumn Meeting 2019

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6 Thin Films and Surfaces » 6.6 Probe Microscopy

[18p-C310-1~14] 6.6 Probe Microscopy

Wed. Sep 18, 2019 1:30 PM - 5:15 PM C310 (C310)

Takashi Ichii(Kyoto Univ.), Yoichi Otsuka(Osaka Univ.)

4:30 PM - 4:45 PM

[18p-C310-12] Nanoscale Characterization of Surface Structures of Liquid Crystal Alignment Layer by Atomic Force Microscopy

〇Takumi Yoshino1, Kazuki Miyata1,2, Keisuke Miyazawa1,2, Takeshi Fukuma1,2 (1.Grad. School, Kanazawa Univ., 2.WPI-NanoLSI, Kanazawa Univ.)

Keywords:AFM, Alignment Layer