11:45 AM - 12:00 PM
[19a-E305-11] Study of annealing condition for improving quality of Si/Hf0.5Zr0.5O2 interface
Keywords:ferroelectrics, annealing
Oral presentation
13 Semiconductors » 13.3 Insulator technology
Thu. Sep 19, 2019 9:00 AM - 12:15 PM E305 (E305)
Shosuke Fujii(Toshiba Memory), Yasushi Hotta(Univ. of Hyogo)
11:45 AM - 12:00 PM
Keywords:ferroelectrics, annealing