The 80th JSAP Autumn Meeting 2019

Presentation information

Poster presentation

16 Amorphous and Microcrystalline Materials » 16.1 Fundamental properties, evaluation, process and devices in disordered materials

[19p-PA7-1~10] 16.1 Fundamental properties, evaluation, process and devices in disordered materials

Thu. Sep 19, 2019 4:00 PM - 6:00 PM PA7 (PA)

4:00 PM - 6:00 PM

[19p-PA7-8] AC Impedance measurement under gamma-ray irradiation on GeTe thin films

〇(M2)Hyoseong Park1, Tatsuya Watanabe1, Isao Yoda2, Yoshinori Shohmitsu3, Shigeo Kawasaki3, Toshihiro Nakaoka1 (1.Sophia Univ., 2.Tokyo Tech, 3.JAXA)

Keywords:GeTe, Gamma-ray, Impedance