2019年第80回応用物理学会秋季学術講演会

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8 プラズマエレクトロニクス » 8.2 プラズマ成膜・エッチング・表面処理

[20a-PA4-1~14] 8.2 プラズマ成膜・エッチング・表面処理

2019年9月20日(金) 09:30 〜 11:30 PA4 (第一体育館)

09:30 〜 11:30

[20a-PA4-5] Morphological Characterization of RF Magnetron Sputtered Zinc Oxide Thin Films-Laser Assisted

〇(M2)Edrick Abu Saidu1、Akio Sanpei1、Wataru Wakaki1、Yasuaki Hayashi1、Haruhiko Himura1 (1.Kyoto Inst. of Tech.)

キーワード:RF Magnetron Sputtering, Zinc Oxide, Laser irradiation

In this work, ZnO thin films were deposited on a-sapphire, c-sapphire and synthetic quartz substrates at different laser irradiation times (i.e. 0 mins, 15mins & 30mins) and at varying magnetic field strengths (i.e. B=0 Gauss, B=167 Gauss & B=1200 Gauss). The surface morphologies and compositions of the ZnO thin films were analyzed using scanning electron microscopy. The microstructural parameters, such as the particle number density and crystallite average diameter were calculated. Variation in the surface morphology of the thin films due to laser irradiation was observed. The surface morphological features of the laser irradiated films revealed the presence of crystalline grain size. UV-Vis spectroscopy was also used to investigate the optical properties of the ZnO thin films.