[20p-C309-1~10] Applications of new ferroelecric materials for the future electric devices

[20p-C309-7] Structure Fluctuation Analysis of a Mn-doped BiFeO₃ Thin Film by a X-ray Fluorescence Holograpy

〇Yakumo Fuchiwaki¹, Seiji Nakashima¹, Hironori Fujisawa¹, Yuta Kurokawa¹, Naohisa Happo², Koji Kimura³, Yuta Yamamoto³, Ryohei Matsumoto³, Koichi Hayashi³ (1.Univ of Hyogo, 2.Hiroshima City Univ, 3.Nagoya Inst of Tech)

Keywords:X-ray fluorescence holography