The 80th JSAP Autumn Meeting 2019

Presentation information

Oral presentation

6 Thin Films and Surfaces » 6.1 Ferroelectric thin films

[21p-C309-1~9] 6.1 Ferroelectric thin films

Sat. Sep 21, 2019 1:45 PM - 4:00 PM C309 (C309)

Tomoaki Yamada(Nagoya Univ.), Takashi Nakajima(Tokyo Univ. of Sci.)

1:45 PM - 2:00 PM

[21p-C309-1] Piezoelectric properties of PZT single crystal thin film using tetragonal zirconia

Takeshi Kijima1, Takekazu Shigenai1, Yukinori Tani1, Akio Konishi1 (1.KRYSTAL Inc.)

Keywords:Tetragonal zirconia, Single crystal PZT, Growing anything into a single crystal

By using ZrO2 (100) for the buffer layer, a very high quality PZT (001) single crystal thin film could be obtained. From the pole figure, as a result of coherent growth of the PZT thin film on Cube on cube on Si, it was a very good c-axis single orientation film. At the same time, very excellent physical properties (Tc > 600 degree C) and piezoelectricity (d31 = −250 pm / V) were exhibited.