Keichi Osada

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Speaker, Author, Co-Author

Sun. Mar 10, 2019 9:00 AM - 11:45 AM W321 (W321)

Oral presentation
| 23 Joint Session N "Informatics"
| 23.1 Joint Session N "Informatics"

[10a-W321-1~10] 23.1 Joint Session N "Informatics"

10:45 AM - 11:00 AM

△ [10a-W321-7] Constraint and batch Bayesian optimization of grinding condition of SiC wafer

〇(M1C)Keichi Osada^1,2, Yosuke Tsunooka^1,2,3, Kiyoshi Narita⁴, Haruhiko Koizumi², Kentaro Kutsukake⁵, Shunta Harada^1,2, Miho Tagawa^1,2, Toru Ujihara^1,2,3 (1.Grad. School Eng., Nagoya Univ., 2.IMaSS, Nagoya Univ., 3.GaN-OIL, AIST, 4.Nitolex, 5.AIP, RIKEN)

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