Yukiharu URAOKA

→ Search for Yukiharu URAOKA in Google Scholar

Speaker, Author, Co-Author

Sun. Mar 10, 2019 1:30 PM - 5:15 PM W241 (W241)

Symposium (Oral)
| Symposium
| Pioneering of Frontier technology for metal oxide novel device I -from thin film fabrication to device creation -

[10p-W241-1~8] Pioneering of Frontier technology for metal oxide novel device I -from thin film fabrication to device creation -

1:30 PM - 2:15 PM

[10p-W241-1] Reliability deterioration phenomenon of metal oxide thin film transistor

〇Yukiharu URAOKA¹, Paolo Bermundo¹, Mami Fujii¹, Mutsunori Uenuma¹, Yasuaki Ishikawa¹ (1.NAIST)