Jun Yoshigiwa

→ Search for Jun Yoshigiwa in Google Scholar

Speaker, Author, Co-Author

Mon. Mar 11, 2019 9:00 AM - 11:45 AM W933 (W933)

Oral presentation
| 6 Thin Films and Surfaces
| 6.6 Probe Microscopy

[11a-W933-1~11] 6.6 Probe Microscopy

10:00 AM - 10:15 AM

[11a-W933-5] Dependence of spatial resolution on probe load in SSRM measurements

〇Jun Yoshigiwa¹, Koichiro Saga¹ (1.Sony Semicon Corp.)