Takeshi Nanke

→ Search for Takeshi Nanke in Google Scholar

Speaker, Author, Co-Author

Mon. Mar 11, 2019 1:15 PM - 5:15 PM M136 (H136)

Oral presentation
| 13 Semiconductors
| 13.3 Insulator technology

[11p-M136-1~14] 13.3 Insulator technology

1:45 PM - 2:00 PM

[11p-M136-3] Charge trapping characteristics in SiO₂ during application of electric stress at high temperature

〇(M2)Takeshi Nanke¹, Ryu Hasunuma¹ (1.Univ. of Tuskuba)