The 66th JSAP Spring Meeting, 2019

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13 Semiconductors » 13.5 Semiconductor devices/ Interconnect/ Integration technologies

[10a-S221-1~11] 13.5 Semiconductor devices/ Interconnect/ Integration technologies

Sun. Mar 10, 2019 9:00 AM - 12:00 PM S221 (S221)

Yukinori Ono(Shizuoka Univ.), Tetsuo Kodera(Tokyo Tech)

11:15 AM - 11:30 AM

[10a-S221-9] Charge pumping electrically-detected magnetic resonance on silicon MOS interfaces

〇Masahiro Hori1, Toshiaki Tsuchiya1, Yukinori Ono1 (1.Shizuoka Univ.)

Keywords:interface defect, charge pumping, EDMR