The 66th JSAP Spring Meeting, 2019

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6 Thin Films and Surfaces » 6.6 Probe Microscopy

[10a-W933-1~8] 6.6 Probe Microscopy

Sun. Mar 10, 2019 9:00 AM - 11:00 AM W933 (W933)

Yoichi Otsuka(Osaka Univ.)

10:15 AM - 10:30 AM

△ [10a-W933-6] Frequency response of depletion capacitance in electrostatic force microscopy with dual bias modulation

〇Ryota Fukuzawa1, Takuji Takahashi1,2 (1.IIS, The Univ. Tokyo, 2.NanoQuine)

Keywords:electrostatic force microscopy, depletion capacitance, interface level