Dielectric measurement with using a resonance at the back side of the probe at 300 GHz band

Ryo Sakamaki; Masahiro Horibe; Takaaki Tsurumi

Presentation information

Oral presentation

9 Applied Materials Science » 9.1 Dielectrics, ferroelectrics

[10p-M116-1~22] 9.1 Dielectrics, ferroelectrics

Sun. Mar 10, 2019 1:00 PM - 7:00 PM M116 (H116)

Hajime Nagata(Tokyo Univ. of Sci.), Satoshi Wada(Univ. of Yamanashi), Takaaki Morimoto(National Defence Academy)

1:30 PM - 1:45 PM

[10p-M116-3] Dielectric measurement with using a resonance at the back side of the probe at 300 GHz band

〇Ryo Sakamaki^1,2, Masahiro Horibe¹, Takaaki Tsurumi² (1.AIST, 2.TITECH)

Keywords:Dielectric material, Measurement technique, Millimeter-wave frequency

This study demonstrates a low-loss dielectric measurement by using high-frequency probes at 300 GHz band. The measurement technique utilizes a resonance at the back side of the probe, which is contacted at the middle of a transmission line. Dielectric permittivity of alumina is evaluated as 9.2-10 at millimeter-wave frequencies.