The 66th JSAP Spring Meeting, 2019

Presentation information

Poster presentation

7 Beam Technology and Nanofabrication » 7 Beam Technology and Nanofabrication (Poster)

[10p-PA6-1~6] 7 Beam Technology and Nanofabrication (Poster)

Sun. Mar 10, 2019 4:00 PM - 6:00 PM PA6 (PA)

4:00 PM - 6:00 PM

[10p-PA6-2] Measurement of the complex refractive index of a porous-like silver pipe and a flat silver film, and their observation by using SEM and TEM

Fumiaki Tajima1, Yoshio Nishiyama1 (1.Yokohama Nat'l Univ.)

Keywords:silver pipe, complex refractive index, porous-like structure

A silver pipe having an outer diameter of 490 nm and a wall thickness of 50 nm is prepared and the complex refractive index of the pipe is determined by light scattering at a wavelength of 660 nm. The value obtained differs from a so-called bulk value. A flat silver film is also prepared and observed with FESEM, and the two are compared. It is inferred that the pipe has a porous-like structure, but the flat silver film is composed of silver particles of large size but no gaps. From the cross-sectional image of another sample pipe by TEM, it is found to be a porous-like structure. It is considered that the difference between the two values is due to the porous-like structure.