[10p-W611-1~14] 16.3 Bulk, thin-film and other silicon-based solar cells

[10p-W611-9] Study on location with potential induced degradation of photovoltaic module - Possibility of local degradation around finger electrodes -

〇Hiroki Yoshida¹, Fumitaka Ohashi¹, Nobukazu Kameyama¹, Yasushi Sobajima¹, Yukiko Hara², Atsushi Masuda², Shuichi Nonomura¹ (1.Gifu Univ., 2.AIST)

Keywords:potential induced degradation, silicon photovoltaic module

Potential induced degradation (PID) is occured with high voltage supply between photovoltaic (PV) modules and thier frams in the condition of high temperature and high humidity. The finger electrodes may be a part of the leak current path under high voltage supply. The local locations of finger electrodes will be affected by the consentrated sodium ions. In order to study on the location with PID of PV modules, the photon injecting Photoluminescence method and the carrier injecting Electroluminescence method are considered.