The 66th JSAP Spring Meeting, 2019

Presentation information

Symposium (Oral)

Symposium » Nanoscale 2D/3D analyses for new device and materials development II

[10p-W933-1~9] Nanoscale 2D/3D analyses for new device and materials development II

Sun. Mar 10, 2019 1:30 PM - 5:45 PM W933 (W933)

Yuji Matsumoto(Tohoku Univ.), Takashi Furukawa(Hitachi High-Technologies Corporation)

3:15 PM - 3:30 PM

[10p-W933-5] Surface termination analysis of LaAlO3(001) substrates using ion-scattering spectroscopy

Jiyeon N Lee1, Jeong Rae Kim2,3, Junsik Mun2,4, Yoonkoo Kim2,4, Yeong Jae Shin2,3, Bongju Kim2,3, Saikat Das2,3, Lingfei Wang2,3, Miyoung Kim2,4, Tae Heon Kim5, Tae Won Noh2,3, Mikk Lippmaa1 (1.ISSP, Univ. of Tokyo, 2.CCES, IBS, 3.Seoul Nat'l Univ., 4.RIAM, Seoul Nat'l Univ., 5.Univ. of Ulsan)

Keywords:oxide, substrate, ion-scattering spectroscopy

Oxide single crystal substrates with atomically smooth and chemically uniform surfaces are indispensable for constructing sharp epitaxial heterointerfaces and investigating the emergent physical phenomena. So far, LaAlO3(001) substrate have been utilized as a structure template to epitaxially grow a variety of oxide films. However, well-established recipe for this substrate is rarely reported due to the unstable charged surfaces of LaO+ or AlO2-. Here, we report a simple recipe to realize atomically-flat and AlO2-single-terminated LaAlO3(001) substrate surfaces.