The 66th JSAP Spring Meeting, 2019

Presentation information

Print

Oral presentation

6 Thin Films and Surfaces » 6.6 Probe Microscopy

[11a-W933-1~11] 6.6 Probe Microscopy

Mon. Mar 11, 2019 9:00 AM - 11:45 AM W933 (W933)

Toyokazu Yamada(Chiba Univ.)

11:00 AM - 11:15 AM

[11a-W933-9] Measurement of sample surface resistance by non-contact atomic force microscopy

〇Tengo Maruyama1, Kohei Oida1, Daiki Kura1, Masahiko Tomitori2, Toyoko Arai1 (1.Kanazawa Univ., 2.JAIST)

Keywords:surface resistance, atomic force microscopy