Energy band alignment of Al<sub>2</sub>O<sub>3</sub>/Air/H-diamond heterointerface determined by synchrotron x-ray photoelectron spectroscopy

Presentation information

Oral presentation

6 Thin Films and Surfaces » 6.2 Carbon-based thin films

[11p-M113-1~20] 6.2 Carbon-based thin films

Mon. Mar 11, 2019 1:15 PM - 7:00 PM M113 (H113)

1:45 PM - 2:00 PM

〇Niloy Chandra Saha¹, Kazutoshi Takahashi², Masaki Imamura², Makoto Kasu¹ (1.Saga univ., 2.SL Center, Saga Univ.)

Keywords:Synchotron XPS, H-diamond, Band-alignment

In this study, energy band alignment of Al₂O₃ layer deposited air-exposed H-diamond is determined using x-ray photoelectron spectroscopy (XPS).