The 66th JSAP Spring Meeting, 2019

Presentation information

Oral presentation

1 Interdisciplinary Physics and Related Areas of Science and Technology » 1.5 Instrumentation, measurement and Metrology

[11p-M116-1~15] 1.5 Instrumentation, measurement and Metrology

Mon. Mar 11, 2019 1:15 PM - 5:00 PM M116 (H116)

Nao Terasaki(AIST), Abe Hisashi (AIST), Minami Amano(AIST)

3:30 PM - 3:45 PM

[11p-M116-10] Development of High Sensitivity Photothermal Microscopic Imaging

Takayoshi Kobayashi1,2, Kazuaki Nakata1,2, Hiromichi Tsurui3 (1.Univ. of Electro-Communications, 2.Tokyo Univ. Science, 3.Juntendo Univ.)

Keywords:micorscope, photothermal effect, super resolution

A photothermal microscopy (PTM) is one type of a pump-probe microscopy. The principle of this method is as follows. This microscopy obtains an image by probing (using a probe light) the distributed refractive index change on the focal surface brought about by thermal effect caused by the absorption of pump laser having spectrum corresponding to the absorption spectrum of a target material. The distributed refractive index change induces change in the Mie scattering process of probe light. This PTM method can have imaging resolution beyond the diffraction limit. We have developed a novel high sensitivity, high resolution, and high imaging speed PTM. By applying the method we could discriminate the benign and malignant cancer cells in a mouse skin tissue specimen.