The 66th JSAP Spring Meeting, 2019

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Oral presentation

13 Semiconductors » 13.2 Exploratory Materials, Physical Properties, Devices

[11p-W834-1~18] 13.2 Exploratory Materials, Physical Properties, Devices

Mon. Mar 11, 2019 1:15 PM - 6:30 PM W834 (W834)

Takashi Suemasu(Univ. of Tsukuba), Hirokazu Tatsuoka(Shizuoka Univ.), Kenji Yamaguchi(QST), Kosuke Hara(Univ. of Yamanashi)

1:15 PM - 1:30 PM

[11p-W834-1] Spectral sensitivity dependending on junction depth in Mg2Si PDs

〇Haruhiko Udono1, Yuuma Onizawa1, Tatsuya Nakano1 (1.Ibaraki Univ.)

Keywords:Semiconducting Silicide