The 66th JSAP Spring Meeting, 2019

Presentation information

Oral presentation

13 Semiconductors » 13.4 Si processing /Si based thin film / MEMS / Equipment technology

[9a-M114-1~12] 13.4 Si processing /Si based thin film / MEMS / Equipment technology

Sat. Mar 9, 2019 9:00 AM - 12:00 PM M114 (H114)

Hitoshi Habuka(Yokohama National University), Masato Sone(Tokyo Tech)

9:30 AM - 9:45 AM

[9a-M114-3] Film Characteristics deposited by Minimal Fab TiN Reactive Sputtering Tool (2)

Shuichi Noda1, Kazuhiro Koga2, Kazumasa Nemoto1, Yuuki Yabuta3, Naoko Yamamoto3, Ryuichiro Kamei3, Sommawan Khumpuang1,2, Shiro Hara1,2 (1.AIST, 2.MINIMAL, 3.Seinan-kogyo)

Keywords:minimalfab, TiN metal gate, TiN reactive sputter