Keiya Fujimoto

→ Search for Keiya Fujimoto in Google Scholar

Speaker, Author, Co-Author

Fri. Sep 11, 2020 9:00 AM - 11:30 AM Z23

Oral presentation
| 15 Crystal Engineering
| 15.6 Group IV Compound Semiconductors (SiC)

[11a-Z23-1~9] 15.6 Group IV Compound Semiconductors (SiC)

11:15 AM - 11:30 AM

[11a-Z23-9] Visualization of Thermal Diffusion Process in SiC Wafer by Optical-Interference Contactless Thermometer (OICT)

〇Keiya Fujimoto¹, Tatsuki Koyanagi², Yuri Mizukawa¹, Hiroaki Hanafusa¹, Seiichiro Higashi¹ (1.AdSE,Hiroshima Univ., 2.AdSM,Hiroshima Univ.)