The 81st JSAP Autumn Meeting, 2020

Presentation information

Oral presentation

13 Semiconductors » 13.2 Exploratory Materials, Physical Properties, Devices

[11a-Z01-1~11] 13.2 Exploratory Materials, Physical Properties, Devices

Fri. Sep 11, 2020 8:30 AM - 11:30 AM Z01

Takashi Suemasu(Univ. of Tsukuba), Kosuke Hara(Univ. of Yamanashi)

9:15 AM - 9:30 AM

[11a-Z01-4] Increase of resistance switching ratio in the Fe3O4 film memory including iron silicide nanodots by locally intensifying electric field

Takafumi Ishibe1, Nobuyasu Naruse2, Yutaka Mera2, Yoshiaki Nakamura1 (1.Osaka Univ., 2.Shiga Univ. Medical Science)

Keywords:Iron silicide, Resistive switching memory, Nanodot

Fe3O4 film/Si is more advantageous than other resistive switching material in terms of good compatibility with Si process, low-cost ecofriendly material, etc. We have developed epitaxial Fe3O4 film/a-FeSi2 layer/Si sandwitch structure, and achieved high Off/On resistance ratio of ~140, which is the maximum value in nanoscale Fe3O4 material. However, further increase of Off/On resistance ratio is strongly required for social use. In this study, we greatly increase Off/On resistance ratio by introducing metal a-FeSi2 nanodot in Fe3O4 film, where a-FeSi2 nanodot works as the site that an electric field is locally intensified, and the higher electric field promotes oxygen ion movement.