[9p-Z24-1~14] 【CS.7】 Code-sharing Session of 7.4 & 9.5

[9p-Z24-9] One dimensional elemental mapping of a Ge quantum dot by XANAM

〇Shushi Suzuki¹, Shingo Mukai², Wang-Jae Chun³, Masaharu Nomura⁴, Syuntarou Fujimori¹, Mitsuhisa Ikeda¹, Katsunori Makihara¹, Seiichi Miyazaki¹, Kiyotaka Asakura² (1.Nagoya Univ., 2.Hokkaido Univ., 3.ICU, 4.KEK-PF)

Keywords:Synchrotron radiation X-ray, NC-AFM, Germanium quantum dot

We have developed X-ray aided noncontact atomic force microscope (XANAM) that combines NC-AFM and synchrotron radiation X-rays to study chemical analysis of a sample surface at the nanoscale. We previously reported that Ge quantum dots under X-ray irradiation could be imaged at the nanoscale. In the present study, we report another result of the X-ray energy dependence of Ge quantum dot images in high precision and discuss the origin of X-ray induced force change in the spatially-resolved XANAM image at the nanoscale.