Riku Kobayashi

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Speaker, Author, Co-Author

Thu. Mar 12, 2020 9:00 AM - 12:15 PM D419 (11-419)

Oral presentation
| Joint Session K "Wide bandgap oxide semiconductor materials and devices"
| 21.1 Joint Session K "Wide bandgap oxide semiconductor materials and devices"

[12a-D419-1~12] 21.1 Joint Session K "Wide bandgap oxide semiconductor materials and devices"

11:15 AM - 11:30 AM

△ [12a-D419-9] Reliability of an amorphous carbon-doped In₂O₃ thin-film transistors under negative and positive bias stress

〇Riku Kobayashi^1,2, Toshihide Nabatame², Kazunori Kurishima^1,2,3, Takashi Onaya^1,2,4, Akihiko Ohi², Naoki Ikeda², Takahiro Nagata², Kazuhito Tsukagoshi², Atsushi Ogura¹ (1.Meiji Univ., 2.WPI-MANA, NIMS, 3.JSPS Research Fellow PD, 4.JSPS Research Fellow DC)