Yutaka Hayashi

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Speaker, Author, Co-Author

Thu. Mar 12, 2020 1:15 PM - 5:30 PM A403 (6-403)

Oral presentation
| 16 Amorphous and Microcrystalline Materials
| 16.3 Bulk, thin-film and other silicon-based solar cells

[12p-A403-1~15] 16.3 Bulk, thin-film and other silicon-based solar cells

3:45 PM - 4:00 PM

[12p-A403-10] Characterization of degradation by PDA of MoO_x CSC/cSi heterojunction cell (3):
By monitoring the variation of S/D conductance by PDA of a FET-TEG
with the lateral surface inversion layer as the channel (1)

〇Yutaka Hayashi¹, Takefumi Kamioka^2,1, Kazuhiro Gotoh³, Ryo Ozaki¹, Kyotaro Nakamura¹, Motoo Morimura¹, Noritaka Usami³, Yoshio Ohshita¹, Atsushi Ogura² (1.Toyota Techno. Inst., 2.Meiji Univ., 3.Nagoya Univ.)