Kazuki Shida

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Speaker, Author, Co-Author

Thu. Mar 12, 2020 1:45 PM - 4:15 PM D519 (11-519)

Oral presentation
| 15 Crystal Engineering
| 15.5 Group IV crystals and alloys

[12p-D519-1~10] 15.5 Group IV crystals and alloys

2:15 PM - 2:30 PM

△ [12p-D519-3] Depth-resolved tomographic analysis of high-Ge-content SiGe/compositionally graded SiGe/Si stacked structure using nanobeam X-ray diffraction

〇Kazuki Shida¹, Tetsuya Tohei¹, Yusuke Hayashi¹, Kazushi Sumitani², Yasuhiko Imai², Shigeru Kimura², Akira Sakai¹ (1.Grad. Sch. Eng. Sci., Osaka Univ., 2.JASRI)

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