Kenji Shiojima

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Speaker, Author, Co-Author

Fri. Mar 13, 2020 9:30 AM - 11:30 AM PA6 (PA)

Poster presentation
| 15 Crystal Engineering
| 15.6 Group IV Compound Semiconductors (SiC)

[13a-PA6-1~11] 15.6 Group IV Compound Semiconductors (SiC)

9:30 AM - 11:30 AM

[13a-PA6-11] Mapping of Schottky contacts on p-4H-SiC wafers using scanning internal photoemission microscopy

〇Kenji Shiojima¹, Fatin Nabilah¹, Roy Matsuda¹, Masashi Kato² (1.Univ. of Fukui, 2.Nagoya Inst. of Tech.)