Takashi Hamaguchi

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Speaker, Author, Co-Author

Sun. Mar 15, 2020 9:00 AM - 12:30 PM A305 (6-305)

Oral presentation
| 13 Semiconductors
| 13.3 Insulator technology

[15a-A305-1~13] 13.3 Insulator technology

11:00 AM - 11:15 AM

△ [15a-A305-8] Correlation between the temperature dependence of Al₂O₃/SiO₂ interface dipole layer strength with the density of oxides

〇Takashi Hamaguchi¹, Koji Kita¹ (1.Tokyo Univ.)