The 67th JSAP Spring Meeting 2020

Presentation information

Oral presentation

7 Beam Technology and Nanofabrication » 7.1 X-ray technologies

[14a-B508-1~11] 7.1 X-ray technologies

Sat. Mar 14, 2020 9:00 AM - 12:00 PM B508 (2-508)

Mitsunori Toyoda(Tokyo Polytechnic Univ.)

9:30 AM - 9:45 AM

[14a-B508-3] Development of wide-band X-ray imasing spectrometor using the CMOS image sonsor for optical use

Junko Hiraga1, Yasuaki Kamata1, Daito Yuhi1, Yoshida Masayuki1, Urabe Yukino1, Hiroshi Nakajima2 (1.Kwansei gakuin Univ., 2.Kanto gakuin Univ.)

Keywords:CMOS image sensor, X-ray photon counting

In recent years, low noise CMOS image sensors have been realized, especially for optical use and several scientific space missions have plans to employ CMOS image sensors instead of conventional X-ray CCDs. In this study, X-ray spectral performance was evaluated using a front-illuminated CMOS image sensor with a pixel size of 6.5 μm × 6.5 μm. As a result, we obtained wide band spectrum 1.5keV to 25keV with good energy resolution of ΔE / E ~ 3% @ 22keV.