The 67th JSAP Spring Meeting 2020

Presentation information

Oral presentation

7 Beam Technology and Nanofabrication » 7.1 X-ray technologies

[14a-B508-1~11] 7.1 X-ray technologies

Sat. Mar 14, 2020 9:00 AM - 12:00 PM B508 (2-508)

Mitsunori Toyoda(Tokyo Polytechnic Univ.)

9:45 AM - 10:00 AM

[14a-B508-4] SX-STED imaging in soft X-ray excited luminescence

Takeo Ejima1, Toshitaka Wakayama2, Takayuki Ishiyama2, Kyoya Anraku4, Ryousuke Kaneda4, Shomitt Roy4, Jyunichi Tsuda4, Kazuyuki Sakagami3, Takeshi Higashiguchi4 (1.IMRAM, Tohoku Univ., 2.Saitama Med. Univ., 3.UT-PSC, 4.Utsunomiya Univ.)

Keywords:STED, scintillator, soft X-ray

Size of luminescence area was examined using vector polarized light in the luminescence of Ce:LSO excited by an X-ray, and the result shows that the diameter size of the luminescent region is 1/10 of the diameter of the irradiated vector beam. Based on these results, spatial resolutions of two types of imaging methods to which this SX-STED phenomenon is applied, a radiographic imaging and an imaging using an aberration-free soft X-ray imaging optics, are calculated and compared with that of a conventional imaging using Zone Plate optics. As a result, the spatial resolution of the two imaging techniques will be higher than that of the Zone Plate on the lower energy region than the oxygen absorption edge.