2:30 PM - 2:45 PM
△ [10p-N304-5] Characterization of Electronic Charged States of High Density Self-aligned Si-based Quantum Dots Evaluated with AFM/Kelvin Prove Technique
Keywords:Si-based quantum dots, AFM/KFM, Charge distribution
Presentation information
Oral presentation
13 Semiconductors » 13.1 Fundamental properties, surface and interface, and simulations of Si related materials
[10p-N304-1~10] 13.1 Fundamental properties, surface and interface, and simulations of Si related materials
Fri. Sep 10, 2021 1:30 PM - 4:15 PM N304 (Oral)
Koichiro Saga(Sony), Nobuya Mori(Osaka Univ.)