[10p-N304-1~10] 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

[10p-N304-6] Simulation of ion-strike position dependence of heavy ion-induced noise pulses with two photon absorption pulsed-laser

〇Takumi Deguchi^1,2, Daisuke Kobayashi², Kazuyuki Hirose^1,2 (1.Tokyo Univ., 2.JAXA)

Keywords:soft error, two photon absorption pulsed-laser, single event transient