1:15 PM - 1:30 PM
[10p-N321-2] MBE of stoichiometric Tin-Telluride(100) thin films
Keywords:semiconductor, Tin-Telluride, X-ray diffraction
Tin-Telluride is expected applying to spintronics. We have tried that MBE of Tin-Telluride thin films on a GaAs(100) substrate. I'm going to explain about crystalline of the samples with the result of X-ray diffraction measurement.