[16p-Z33-1~14] 6.3 Oxide electronics

[16p-Z33-2] Impacts of Ru Deficiencies on Current-Induced Resistive Transition in Epitaxial Thin Films of Ca₂RuO₄

〇Atsushi Tsurumaki-Fukuchi¹, Keiji Tsubaki¹, Tenki Ishida¹, Takayoshi Katase², Toshio Kamiya², Masashi Arita¹, Yasuo Takahashi¹ (1.Hokkaido Univ., 2.Tokyo Tech.)

Keywords:metal-insulator transition, Ca2RuO4, Mott memory