The 68th JSAP Spring Meeting 2021

Presentation information

Oral presentation

15 Crystal Engineering » 15.3 III-V-group epitaxial crystals, Fundamentals of epitaxy

[17p-Z28-1~14] 15.3 III-V-group epitaxial crystals, Fundamentals of epitaxy

Wed. Mar 17, 2021 1:30 PM - 6:00 PM Z28 (Z28)

Nobuhiko Ozaki(Wakayama Univ.), Toshiyuki Kaizu(Kobe Univ.), Yoriko Tominaga(Hiroshima Univ.), Kentaro Onabe

2:45 PM - 3:00 PM

[17p-Z28-4] Impact of GaAs Interlayer Thickness on the Radiative Efficiency of InGaAs/GaAsP

Maui Hino1, Meita Asami1, Kentaroh Watanabe2, Yoshiaki Nakano1, Masakazu Sugiyama1,2 (1.The Univ. of Tokyo, 2.RCAST)

Keywords:quantum well, hetero interface, photoluminescence

In InGaAs/GaAsP strain compensation multiple quantum wells, it is important to control the hetero interface between compressive and strain for improving the radiative efficiency. Though it is known that the no strain GaAs interlayer insertion is effective, it is not clear that the influence of the interlayer thickness to the radiative efficiency. In this research, InGaAs/GaAsP MQW samples including GaAs interlayer with different thickness above or below InGaAs layer were fabricated by MOCVD and evaluated by photoluminescence.