The 68th JSAP Spring Meeting 2021

Presentation information

Oral presentation

7 Beam Technology and Nanofabrication » 7.3 Micro/Nano patterning and fabrication

[18a-Z16-1~8] 7.3 Micro/Nano patterning and fabrication

Thu. Mar 18, 2021 9:00 AM - 11:15 AM Z16 (Z16)

Jiro Yamamoto(Hitachi), Jun Taniguchi(Tokyo Univ. of Sci.)

11:00 AM - 11:15 AM

[18a-Z16-8] Dry Etching of Photo-Cured Masks for Area Selective Atomic Layer Deposition

Chiaki Miyajima1, Shunya Ito1, Masaru Nakagawa1 (1.IMRAM, Tohoku Univ.)

Keywords:dry etching, atomic layer deposition, UV nanoimprinting

Atomic layer deposition (ALD) is one of the promising bottom-up technologies to integrate functional inorganic oxide layers on substrates by mutual doses of inorganic precursor and oxidant agents. Taking accounts of differences in deposition behavior of aluminum oxide between bare inorganic substrate and mask organic resin surfaces, we attempt to develop novel methods for area selective deposition by combining UV nanoimprinting and ALD. In this study, we achieved complete removal of UV-cured resin thin films after deposition of aluminum oxide by physical and chemical dry etching processes.