Ryohei Yoshizu

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Speaker, Author, Co-Author

Wed. Sep 21, 2022 1:30 PM - 4:30 PM C105 (C105)

Oral presentation
| 13 Semiconductors
| 13.5 Semiconductor devices/ Interconnect/ Integration technologies

[21p-C105-1~11] 13.5 Semiconductor devices/ Interconnect/ Integration technologies

3:45 PM - 4:00 PM

[21p-C105-9] Accurate Evaluation of Interface Trap Density at InAs MOS Interfaces by C-V Measurements at Low Temperatures

〇(M2)Ryohei Yoshizu¹, Kei Sumita¹, Kasidit Toprasertpong¹, Mitsuru Takenaka¹, Shinichi Takagi¹ (1.Univ. Tokyo)