Daichi Kobayashi

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Speaker, Author, Co-Author

Wed. Sep 21, 2022 1:30 PM - 4:30 PM C201 (C201)

Oral presentation
| 6 Thin Films and Surfaces
| 6.6 Probe Microscopy

[21p-C201-1~11] 6.6 Probe Microscopy

3:45 PM - 4:00 PM

[21p-C201-9] Dual Bias Modulation Electrostatic Force Microscopy on n-Si/n-Si and p-Si/p-Si Junctions Fabricated by Surface-activated Bonding

〇Daichi Kobayashi¹, Jianbo Liang³, Naoteru Shigekawa³, Takuji Takahashi^1,2 (1.IIS, Univ. Tokyo, 2.NanoQuine, Univ. Tokyo, 3.Osaka Metropolitan Univ.)

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