[20a-C202-1~11] 15.7 Crystal characterization, impurities and crystal defects

[20a-C202-5] Identification of Dislocation Characteristics ZnO substrates by Means of Bright-Field X-ray Topography

〇Yusuke Namioka¹, Yusuke Ito¹, Daiki Hayase¹, Yuichi Ota², Yoshiyuki Tsusaka¹ (1.Univ. of Hyogo, 2.TIRI)

Keywords:X-ray, Topography