11:15 AM - 11:30 AM
[21a-C306-9] On the Origin of Molecular Patterns in FEM
Keywords:Field emission microscopy
Experimental studies on the origin of the molecular patterns in FEM
Oral presentation
7 Beam Technology and Nanofabrication » 7.2 Applications and technologies of electron beams
Wed. Sep 21, 2022 9:00 AM - 11:45 AM C306 (C306)
Katsuhisa Murakami(AIST), Takafumi Ishida(Nagoya University)
11:15 AM - 11:30 AM
Keywords:Field emission microscopy