The 83rd JSAP Autumn Meeting 2022

Presentation information

Symposium (Oral)

Symposium » Forefront of interface science and technology of wide bandgap semiconductor MOS devices

[21p-M206-1~9] Forefront of interface science and technology of wide bandgap semiconductor MOS devices

Wed. Sep 21, 2022 1:30 PM - 5:35 PM M206 (Multimedia Research Hall)

Heiji Watanabe(Osaka Univ.), Digh Hisamoto(Hitachi)

3:50 PM - 4:20 PM

[21p-M206-6] MOSFET Interfaces of Wide Gap Semiconductors Studied by Computational Science

Kenji Shiraishi1, Atsushi Oshiyama1 (1.Nagoya Univ.)

Keywords:GaN, SiC, MOSFET Interface

MOSFET interfaces of SiC and GaN have attracted much attentions, because it directly relrated to the power device performance. However, SiC/SiO2 and GaN/SiO2 interfaces have many problems such as large interface defect densities. In this talk, we focu on the characteristics of SiC/SiO2 and GaN/SiO2 interface from a view point of computational sciences.