The 83rd JSAP Autumn Meeting 2022

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Poster presentation

6 Thin Films and Surfaces » 6.6 Probe Microscopy

[22a-P03-1~11] 6.6 Probe Microscopy

Thu. Sep 22, 2022 9:30 AM - 11:30 AM P03 (Arena)

9:30 AM - 11:30 AM

[22a-P03-6] Simultaneous measurements of SPV, CPD, and capacitance by combining AC-KPFM and EFM

〇Masato Miyazaki1, Kenta Noto1, Yasuhiro Sugawara1, Yanjun Li1 (1.Osaka Univ.)

Keywords:surface photovoltage, titanium dioxide, Kelvin probe force microscopy