The 83rd JSAP Autumn Meeting 2022

Presentation information

Oral presentation

13 Semiconductors » 13.7 Compound and power devices, process technology and characterization

[22p-B204-1~18] 13.7 Compound and power devices, process technology and characterization

Thu. Sep 22, 2022 1:30 PM - 6:15 PM B204 (B204)

Masashi Kato(Nagoya Inst. of Tech.)

3:15 PM - 3:30 PM

[22p-B204-8] Fabrication of vertical GaN p-n junction diodes using Mg diffusion

Yuta Ito1, Kawasaki Seiya1, Woong Kwon1, Kenya Shimamura1, Narita Shuhei1, Watanabe Hirotaka2, Deki Manato3, Nitta Shugo2, Honda Yoshio2, Tanaka Atsushi2, Amano Hiroshi2,3,4 (1.Nagoya Univ., 2.IMaSS Nagoya Univ., 3.VBL Nagoya Univ., 4.ARC Nagoya Univ.)

Keywords:ion implantation, Diffusion

Local p-type conduction control of GaN is an essential technique for fabricating vertical power devices. We have focused on the Mg thermal diffusion method using MgGaN layers as a diffusion source as an alternative to the Mg ion implantation method. Compared to the ion implantation method, the thermal diffusion method has fewer defects formed during impurity addition, and thus p-type GaN can be fabricated by heat treatment under atmospheric pressure. In this study, we report on the fabrication and evaluation of p-n junction diodes using the Mg thermal diffusion method.