[26a-E105-1~11] 6.6 Probe Microscopy

[26a-E105-9] Development of a scanning diamond NV center probe and analysis of stray magnetic fields from a magnetic card

〇(M2)Chiyaka Tachioka¹, Pawan Kumar¹, Aoi Ideguchi¹, Kim Seong-Woo², Koji Koyama², Kunitaka Hayashi¹, Yuta Kainuma¹, Toshu An¹ (1.JAIST, 2.Adamant Namiki)

Keywords:NV center, Atomic force microscopy, Optically detected magnetic resonance

The purpose of this study is to evaluate the performance of the developed diamond NV center probe and to identify the magnetic structure of a magnetic card. The measurements were performed by attaching the NV probe to a quartz crystal atomic force microscope combining with confocal laser microscope. We measured ODMR spectra scanning on the magnetic card and obtained fluorescence intensity mapping. We will discuss about variation of fluorescence intensity mapping with frequency, spatial resolution, magnetic sensitivity, methods to reduce the measurement time, estimation of magnetic structure.