Jaehyun Kim

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Speaker, Author, Co-Author

Thu. Mar 16, 2023 1:00 PM - 6:45 PM A403 (Building No. 6)

Oral presentation
| 13 Semiconductors
| 13.5 Semiconductor devices/ Interconnect/ Integration technologies

[16p-A403-1~20] 13.5 Semiconductor devices/ Interconnect/ Integration technologies

3:30 PM - 3:45 PM

[16p-A403-9] Simulation Study on the Effects of Charge Traps in a Ferroelectric Tunnel Junction

〇(M2)Jaehyun Kim¹, Takuya Saraya¹, Toshiro Hiramoto¹, Masaharu Kobayashi^1,2 (1.IIS, Univ. of Tokyo, 2.d.lab, Univ. of Tokyo)